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In [[physics]], '''strain scanning''' is the general name for various techniques that aim to measure the [[deformation (mechanics)|strain]] in a [[crystalline]] material through its effect on the  [[diffraction]] of [[X-rays]] and [[neutrons]]. In these methods the material itself is used as a form of [[strain gauge]].
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The various methods are derived from [[powder diffraction]] but look for the small shifts in the diffraction spectrum that indicate a change a lattice parameter instead of trying to derive unknown structural information. By comparing the lattice parameter to a known reference value it is possible to determine the. If sufficient measurements are made in different directions it is possible to derive the [[strain tensor]].  If the [[elasticity|elastic]] properties of the material are known, one can then compute the [[Cauchy stress tensor|stress tensor]].
 
==Principles==
At its most basic level strain scanning uses shifts in [[Bragg's Law|Bragg diffraction]] peaks to determine the strain. Strain is defined as the change in length (shift in lattice parameter, d) divided by the original length (unstrained lattice parameter, d<sub>0</sub>). In diffraction based strain scanning this becomes the change in peak position divided by the original position. The precise equation is presented in terms of diffraction angle, energy, or - for relatively slow moving neutrons - time of flight:
 
:<math>\epsilon = \frac{\Delta d}{d_0} = \frac{\Delta \theta}{\theta_0} = \frac{\Delta E}{E_0} = \frac{\Delta t}{t_0} \, </math>
 
==Methods==
The details of the technique are heavily influenced by the type of radiation used since lab X-rays, [[synchrotron]] X-rays and neutrons have very different properties. Nevertheless, there is considerable overlap between the various methods.
 
==References==
{{reflist}}
{{unreferenced|date = December 2007}}
 
{{DEFAULTSORT:Strain Scanning}}
[[Category:Diffraction]]
[[Category:Deformation]]
 
 
{{physics-stub}}

Latest revision as of 07:17, 6 January 2015

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